专利名称：AUTOMATED TESTING SYSTEM AND
OPERATING METHOD THEREOF
发明人：Indra G. HARIJONO,Sungjoon AHN申请号：US15634357申请日：20170627
公开号：US20170372800A1公开日：20171228
专利附图：
摘要：A system and an operating method thereof include at least a system under test(SUT) having collection of flash storages including hardware of array of flash storages,collection of partitions including logical volumes, a kernel subsystem including operating
system, and an application layer including services, applications, systems, or acombination thereof; test drivers configured to drive tests, wherein the tests areconfigured for testing the SUT, test fixtures configured to generate test data setscorresponding to the test drivers, observers configured to track test results of test casescreated in accordance with the test drivers and the test data sets, wherein the testresults include metrics, and archives configured to store historical data of the test cases.
申请人：SK Hynix Memory Solutions Inc.
地址：San Jose CA US
国籍：US
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