Test probe for a measuring instrument and tester i

专利名称：Test probe for a measuring instrument and

tester incorporating the test probe

发明人：Manabu Kamiya申请号：US09/021808申请日：19980211公开号：US05942701A公开日：19990824

摘要：There are provided a test probe for a measuring instrument, and a testerincorporating the test probe. The test probe includes a probe, a lead wire, a grip and alead wire-holding piece. A probe for being brought into contact with a measuring objecthas a proximal end. A lead wire has one end thereof connected to a main unit of themeasuring instrument and the other end thereof connected to the probe. A grip protectsa portion connecting the probe and the lead wire. The grip is engaged with the proximalend of the probe. A lead wire-holding piece fixedly holds a distal end of the coveredportion of the lead. The grip has a retaining portion engaged with the lead wire-holdingpiece for preventing the lead wire from being drawn out from the grip. In another form,the test probe has a crimp contact for connecting the proximal end of the probe and anuncovered portion of the lead wire. The grip protects a portion connecting the probe andthe lead wire, including the crimp contact. The grip is fixedly engaged with the proximalend of the probe.

申请人：SEIKO EPSON CORPORATION

代理机构：Oliff & Berridge, PLC

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