专利名称：Apparatus for detecting defects发明人：Amada, Junichi, Nissin Kogyo Co.,
Ltd.,Tuchiya, Tomoharu, Nissin Kogyo Co.,Ltd.
申请号：EP03026032.7申请日：20031112公开号：EP1420257A2公开日：20040519
专利附图：
摘要：An electric parts drive circuit has : a first field-effect transistor including inparallel a first parasitic diode and provided between the plus line and an electric part; a
second field-effect transistor including in parallel a second parasitic diode, the first andsecond field-effect transistors being connected in series in order from the plus line tothe electric part; a third field-effect transistor including in parallel a third parasitic diodeand provided between a minus line and the electric part; a failure diagnosis switch unit;and a switch control unit, wherein the switch control unit diagnoses a failure of thesecond field-effect transistor based on the voltage between the first and second field-effect transistors responsive to switching between conduction and shutoff of the secondfield-effect transistor in a state that the first and third field-effect transistors are shut offand the failure diagnosis switch unit is brought into conduction.
申请人：NISSIN KOGYO CO., LTD.
地址：No. 840, Ohaza Kokubu Ueda-shi, Nagano-ken JP
国籍：JP
代理机构：HOFFMANN - EITLE
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