专利名称：MULTILAYER ANALYSIS ELEMENT发明人：Nakamura, Kentaro,Kawasaki,
Kazuya,Sakaino, Yoshiki,Ito,Toshihisa,Seshimoto, Osamu
申请号：EP05710685.8申请日：20050218公开号：EP1717582B1公开日：20110615
摘要：It is an object of the invention to provide a multilayer analysis element withsmall intra-lot and lot-to-lot differences that has high measurement accuracy and whichis small in size. The present invention provides a multilayer analysis element for liquidsample analysis wherein at least one functional layer and at least one porous liquidsample spreading layer of non-fibrous porous film are integrally laminated in this orderon one side of a water-impermeable planar support, and the non-fibrous porous film hasa bending rupture strength of 20 gram-weight or more and a tensile percentage of 2% orless when the film is stretched with a tensile force of 50 gram-weight.
申请人：FUJIFILM CORP
地址：JP
国籍：JP
代理机构：Albrecht, Thomas
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