专利名称:EFFICIENT MODULATED IMAGING发明人:CUCCIA, DAVID,MAZHAR, AMAAN申请号:EP13852589申请日:20131107公开号:EP2898326A4公开日:20160608
摘要:An apparatus for turbid sample measurement comprising a plurality of lightsources for illuminating a turbid sample target area with non-spatial structured light, aprojection system for illuminating the turbid sample target area with spatial structuredlight, a sensor for collecting light from the turbid sample target area, and a processor toanalyze the data captured by the sensor to yield scattering and absorption coefficientsof the turbid sample. A method comprises illuminating the sample with spatial structuredlight, collecting light reflected from the sample at a number of wavelengths, illuminatingthe sample with non-spatial structured light, collecting light reflected from the sampleat a number of wavelengths, and combining the measurements of the collected light toobtain the optical properties of the sample and/or the concentration of absorbing orfluorescent molecules. The wavelengths of the spatial and non-spatial light sources arepreferably different.
申请人:MODULATED IMAGING INC.
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