专利名称：Structure for and method of aligning beam-defining apertures by means of alignmentapertures
发明人：Sigmund T. Villanyi申请号：US06/643314申请日：19840822公开号：US04607187A公开日：19860819
摘要：A multibeam electron gun comprises two spaced successive electrodesindividually held in position from a common electrically- insulating support. Each of theelectrodes has at least three beam- defining apertures therein. Each of the electrodesalso has two dissimilarly shaped alignment apertures therein which are mutually alignedso that the beam defining apertures are accurately aligned along common axes in astatically determined manner.
申请人：RCA CORPORATION
代理人：Eugene M. Whitacre,Dennis H. Irlbeck,Vincent J. Coughlin, Jr.
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