TESTING MEMORY DEVICES WITH DISTRIBUTED PROCESSING

专利名称：TESTING MEMORY DEVICES WITH

DISTRIBUTED PROCESSING OPERATIONS

发明人：Xinguo ZHANG,Ze'ev RAZ,Ken Hanh Duc

LAI,Edmundo DE LA PUENTE

申请号：US14191342申请日：20140226

公开号：US20150243370A1公开日：20150827

专利附图：

摘要：ATE performs testing of memory devices with distributed processingoperations. A redundancy analysis (RA) system has a first test site processor (TSP),

operable for controlling a testing routine over multiple DUTs and analyzing redundancydata returned from a first of the DUTs. The RA has at least a second TSP, operable foranalyzing redundancy data returned from a second of the DUTs. The RA may have one ormore additional TSPs, each operable for analyzing redundancy data returned from anadditional DUT. Controlling the testing routine includes directing the RA in each of thefirst and second (and any of the additional) TSPs.

申请人：Advantest Corporation

地址：Tokyo JP

国籍：JP

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