METHOD OF INSPECTING QUALITY OF ORGANIC LIGHT-EMIT

专利名称：METHOD OF INSPECTING QUALITY OF

ORGANIC LIGHT-EMITTING DIODE ANDINSPECTING SYSTEM FOR PERFORMING THEMETHOD

发明人：Jung-Jin Yang,Won-Jun Song,Mun-Chae

Yoon,Gyu-Tae Kim,Tae-Woong Yoon

申请号：US14697075申请日：20150427

公开号：US20160103170A1公开日：20160414

专利附图：

摘要：A method of inspecting the quality of an organic light-emitting diode (OLED)and an inspecting system for performing the method are disclosed. In one aspect, themethod includes applying an input voltage to the OLED, measuring an OLED voltageacross the OLED and an OLED current flowing through the OLED, estimating a parameterof the OLED based at least in part on the OLED voltage and the OLED current, andextracting a physical characteristic of the OLED based at least in part on the parameter.

申请人：Samsung Display Co., Ltd,Korea University Research and Business Foundation

地址：Yongin-City KR,Seoul KR

国籍：KR,KR

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