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CY62147DV30资料

2022-10-23 来源:步旅网
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CY62147DV30

4-Mbit (256K x 16) Static RAM

Features

•Temperature Ranges—Industrial: –40°C to +85°C—Automotive-A: –40°C to +85°C—Automotive-E: –40°C to +125°C•Very high speed: 45 ns

•Wide voltage range: 2.20V–3.60V

•Pin-compatible with CY62147CV25, CY62147CV30, and CY62147CV33•Ultra-low active power

— Typical active current: 1.5 mA @ f = 1 MHz— Typical active current: 8 mA @ f = fmax •Ultra low standby power

•Easy memory expansion with CE, and OE features•Automatic power-down when deselected•CMOS for optimum speed/power

•Available in Pb-free and non Pb-free 48-ball VFBGA and non Pb-free 44-pin TSOPII•Byte power-down feature

vanced circuit design to provide ultra-low active current. Thisis ideal for providing More Battery Life™ (MoBL®) in portableapplications such as cellular telephones. The device also hasan automatic power-down feature that significantly reducespower consumption. The device can also be put into standbymode reducing power consumption by more than 99% whendeselected (CE HIGH or both BLE and BHE are HIGH). Theinput/output pins (I/O0 through I/O15) are placed in a high-im-pedance state when: deselected (CE HIGH), outputs are dis-abled (OE HIGH), both Byte High Enable and Byte Low Enableare disabled (BHE, BLE HIGH), or during a write operation (CELOW and WE LOW).

Writing to the device is accomplished by taking Chip Enable(CE) and Write Enable (WE) inputs LOW. If Byte Low Enable(BLE) is LOW, then data from I/O pins (I/O0 through I/O7), iswritten into the location specified on the address pins (A0through A17). If Byte High Enable (BHE) is LOW, then datafrom I/O pins (I/O8 through I/O15) is written into the locationspecified on the address pins (A0 through A17).

Reading from the device is accomplished by taking ChipEnable (CE) and Output Enable (OE) LOW while forcing theWrite Enable (WE) HIGH. If Byte Low Enable (BLE) is LOW,then data from the memory location specified by the addresspins will appear on I/O0 to I/O7. If Byte High Enable (BHE) isLOW, then data from memory will appear on I/O8 to I/O15. Seethe truth table at the back of this data sheet for a completedescription of read and write modes.

The CY62147DV30 is available in a 48-ball VFBGA, 44 PinTSOPII packages.

Functional Description[1]

The CY62147DV30 is a high-performance CMOS static RAMorganized as 256K words by 16 bits. This device features ad-

Logic Block Diagram

A10A9A8A7A6A5A4A3A2A1A0

DATA IN DRIVERS

ROW DECODER 256K x 16RAM Array

SENSE AMPSI/O0–I/O7I/O8–I/O15

COLUMN DECODER

BHEWECEOEBLE

A11A12A13A14A15A16CE

Power-DownCircuit

BHEBLE

Note:

1.For best practice recommendations, please refer to the Cypress application note “System Design Guidelines” on http://www.cypress.com.

A17CypressSemiconductorCorporationDocument #: 38-05340 Rev. *F

•198 Champion Court•

SanJose,CA 95134-1709•408-943-2600

Revised August 31, 2006

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Pin Configuration[2, 3, 4]

CY62147DV30

44 TSOP II (Top View)

VFBGA (Top View)

1BLEI/O8I/O9VSSVCCI/O14I/O15NC

2OEBHEI/O10I/O113A0A3A5A17

4A1A4A6A7A16A15A13A10

5A2CEI/O1I/O3I/O4I/O5WEA11

6NCI/O0I/O2VccVssI/O6I/O7NC

ABCDEFGH

A4A3A2A1A0CEI/O0I/O1I/O2I/O3VCCVSSI/O4I/O5I/O6I/O7WEA17A16A15A14A13

12345678910111213141516171819202122

44434241403938373635343332313029282726252423

I/O12 DNUI/O13NCA8

A14A12A9

A5A6A7OEBHEBLEI/O15I/O14I/O13I/O12VSSVCCI/O11I/O10I/O9I/O8NCA8A9A10A11A12

Product Portfolio

Power Dissipation

ProductCY62147DV30LLCY62147DV30LLCY62147DV30LCY62147DV30LLCY62147DV30LL

RangeIndustrialIndustrialAuto-EIndustrialAuto-A

2.2V

3.0

3.6

70

1.5

3

8

15

2

VCC Range (V)Min.2.2V2.2V

Typ.[5]3.03.0

Max.3.63.6

4555Speed (ns)

Operating ICC (mA)f = 1MHzTyp.[5]1.51.5

Max.33

f = fmaxTyp.[5]108

Max.2015

Standby ISB2

(µA)Typ.[5]22

Max.882588

Notes:

2.NC pins are not internally connected on the die.

3.DNU pins have to be left floating or tied to VSS to ensure proper application.

4.Pins H1, G2, and H6 in the VFBGA package are address expansion pins for 8 Mb, 16 Mb, and 32 Mb, respectively.

5.Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at VCC = VCC(typ.), TA = 25°C.

Document #: 38-05340 Rev. *FPage 2 of 12

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Maximum Ratings

(Above which the useful life may be impaired. For user guide-lines, not tested.)

Storage Temperature .................................–65°C to +150°CAmbient Temperature with

Power Applied.............................................–55°C to +125°CSupply Voltage to Ground

Potential......................................–0.3V to + VCC(MAX) + 0.3VDC Voltage Applied to Outputs

in High-Z State[6,7]..........................–0.3V to VCC(MAX) + 0.3VDC Input Voltage

[6,7]

CY62147DV30

Output Current into Outputs (LOW).............................20 mAStatic Discharge Voltage........................................... >2001V(per MIL-STD-883, Method 3015)

Latch-up Current......................................................>200 mA

Operating Range

DeviceCY62147DV30LCY62147DV30LL

RangeIndustrial

AmbientTemperature

[TA][9]–40°C to +85°C

VCC2.20Vto3.60V

Automotive-E–40°C to +125°CAutomotive-A–40°C to +85°C

.....................–0.3V to VCC(MAX) + 0.3V

Electrical Characteristics (Over the Operating Range)

–45

ParameterDescriptionVOHVOLVIHVILIIX

Test Conditions

VCC = 2.20V VCC = 2.70V VCC = 2.20VVCC = 2.70V

1.82.2–0.3–0.3

Ind’lAuto-A[9]Auto-E[9]IOZ

Output Leakage Current

GND < VO < VCC,Output Disabled

Ind’lAuto-A[9]Auto-E[9]VCC = VCCmaxIOUT = 0 mACMOS levels

101.5

2038

–1

+1

–1

Min.Typ.[5]2.02.4

0.40.4VCC + 0.3VVCC + 0.3V

0.60.8+1

1.82.2–0.3–0.3–1–1–4–1–1–4

81.5

Max.

Output HIGH IOH = –0.1 mAVoltage

IOH = –1.0 mAOutput LOW IOL = 0.1 mAVoltage

IOL = 2.1 mAInput HIGH VoltageInput LOW Voltage

VCC = 2.2V to 2.7VVCC= 2.7V to 3.6VVCC = 2.2V to 2.7VVCC= 2.7V to 3.6V

2.02.4

0.40.4VCC + 0.3VVCC + 0.3V

0.60.8+1+1+4+1+1+41538825

–55/–70

Min.Typ.[5]

Max.

UnitVVVVVVVVµAµAµAµAµAµAmAmAµA

Input Leakage GND < VI < VCCCurrent

ICC

VCC Operating f = fMAX = 1/tRCSupply

f = 1 MHz

Current Automatic CEPower-Down Current — CMOS Inputs

ISB1

Ind’lLLCE > VCC−0.2V,

VIN>VCC–0.2V, VIN<0.2V) Auto-A[9]LL

f = fMAX (Address and Data Only),Auto-E[9]L f = 0 (OE, WE, BHE and BLE), VCC = 3.60V

Ind’l

LL

Auto-A[9]LLAuto-E[9]L

ISB2

Automatic CE CE > VCC – 0.2V,Power-Down VIN > VCC – 0.2V or Current — VIN < 0.2V,CMOS Inputsf = 0, VCC = 3.60V

88825

µA

Notes:

6.VIL(min.) = –2.0V for pulse durations less than 20 ns.

7.VIH(max.) = VCC + 0.75V for pulse durations less than 20 ns.

8.Full device AC operation assumes a 100-µs ramp time from 0 to VCC(min) and 200-µs wait time after VCC stabilization.9.Auto-A is available in –70 and Auto-E is available in –55.

Document #: 38-05340 Rev. *FPage 3 of 12

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Capacitance (for all packages)[10]

Parameter

CINCOUT

Description

Input CapacitanceOutput Capacitance

Test Conditions

TA = 25°C, f = 1 MHz,VCC = VCC(typ)

CY62147DV30

Max.1010

UnitpFpF

Thermal Resistance[10]

Parameter

ΘJAΘJC

Description

Thermal Resistance (Junction to Ambient)Thermal Resistance (Junction to Case)

Test Conditions

Still Air, soldered on a 3 × 4.5 inch, four-layer printed circuit board

VFBGA728.86

TSOP II75.138.95

Unit°C/W°C/W

AC Test Loads and Waveforms[10]

VCCOUTPUT50 pFINCLUDINGJIG ANDSCOPE

R1

VCC

R2

10%GND

Rise Time = 1 V/ns

ALL INPUT PULSES

90%90%

10%

Fall Time = 1 V/ns

Equivalentto:

THÉ VENINEQUIVALENT

RTH

OUTPUTV

3.0V110315546451.75

UnitΩΩΩV

Parameters

R1R2RTHVTH

2.50V166671538580001.20

Data Retention Characteristics (Over the Operating Range)

ParameterVDRICCDR

Description

VCC for Data RetentionData Retention Current

VCC= 1.5V

CE > VCC – 0.2V, VIN > VCC – 0.2V or VIN < 0.2VL (Auto-E)LL (Ind’l/Auto-A)

Conditions

Min.1.5

156

Typ.[5]Max.

UnitVµA

tCDR[10]tR[12]Chip Deselect to Data Retention Time

Operation Recovery Time

0tRC

nsns

Data Retention Waveform[13]

VCCCE orBHE.BLE

VCC(min)

tCDR

DATA RETENTION MODE

VDR>1.5 V

VCC(min)

tR

Notes:

10.Tested initially and after any design or process changes that may affect these parameters.11.Test condition for the 45-ns part is a load capacitance of 30 pF.

12.Full device operation requires linear VCC ramp from VDR to VCC(min.) > 100 µs or stable at VCC(min.) > 100 µs.

13.BHE.BLE is the AND of both BHE and BLE. Chip can be deselected by either disabling the chip enable signals or by disabling both BHE and BLE.

Document #: 38-05340 Rev. *FPage 4 of 12

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CY62147DV30

Switching Characteristics Over the Operating Range[14]

45 ns[11]ParameterRead CycletRCtAAtOHAtACEtDOEtLZOEtHZOEtLZCEtHZCEtPUtPDtDBEtLZBEtHZBE

Write Cycle[17]tWCtSCEtAWtHAtSAtPWEtBWtSDtHDtHZWEtLZWE

Write Cycle TimeCE LOW to Write EndAddress Set-up to Write EndAddress Hold from Write EndAddress Set-up to Write StartWE Pulse Width

BLE/BHE LOW to Write EndData Set-up to Write EndData Hold from Write EndWE LOW to High-Z[15, 16]WE HIGH to Low-Z[15]10454040003540250

15

10554040004040250

20

10706060004560300

25

nsnsnsnsnsnsnsnsnsnsns

Read Cycle TimeAddress to Data Valid

Data Hold from Address ChangeCE LOW to Data ValidOE LOW to Data ValidOE LOW to LOW Z[15]OE HIGH to High Z[15, 16]CE LOW to Low Z[15]CE HIGH to High Z[15, 16]CE LOW to Power-UpCE HIGH to Power-DownBLE/BHE LOW to Data ValidBLE/BHE LOW to Low Z[15]BLE/BHE HIGH to HIGH Z[15, 16]10

15

0

4545

10

20

10

20

0

5555

10

25

5

15

10

20

0

7070

10

4525

5

20

10

25

45

45

10

5525

5

25

55

55

10

7035

70

70

nsnsnsnsnsnsnsnsnsnsnsnsnsns

Description

Min.

Max.

Min.

55 ns

Max.

Min.

70 ns

Max.

Unit

Notes:

14.Test conditions for all parameters other than tri-state parameters assume signal transition time of 3 ns (1 V/ns) or less, timing reference levels of VCC(typ)/2, input

pulse levels of 0 to VCC(typ.), and output loading of the specified IOL/IOH as shown in the “AC Test Loads and Waveforms” section.

15.At any given temperature and voltage condition, tHZCE is less than tLZCE, tHZBE is less than tLZBE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any

given device.

16.tHZOE, tHZCE, tHZBE, and tHZWE transitions are measured when the outputs enter a high impedence state.

17.The internal Write time of the memory is defined by the overlap of WE, CE = VIL, BHE and/or BLE = VIL. All signals must be ACTIVE to initiate a write and any

of these signals can terminate a write by going INACTIVE. The data input set-up and hold timing should be referenced to the edge of the signal that terminates the write.

Document #: 38-05340 Rev. *FPage 5 of 12

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CY62147DV30

Switching Waveforms

Read Cycle 1 (Address Transition Controlled)[18, 19]

tRC

ADDRESS

tOHA

DATA OUT

PREVIOUS DATA VALID

tAA

DATA VALID

Read Cycle No. 2 (OE Controlled)[19, 20]

ADDRESS

CEtACEOEtDOEBHE/BLEtLZOEtRCtPDtHZCEtHZOEtHZBEtDBEtLZBEDATA OUTHIGH IMPEDANCEtLZCEVCCSUPPLYCURRENTtPU50%50%ICCISBDATA VALIDHIGH IMPEDANCENotes:

18.The device is continuously selected. OE, CE = VIL, BHE and/or BLE = VIL.19.WE is HIGH for read cycle.

20.Address valid prior to or coincident with CE and BHE, BLE transition LOW.

Document #: 38-05340 Rev. *FPage 6 of 12

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Switching Waveforms (continued)

Write Cycle No. 1 (WE Controlled)[17, 21, 22]

tWC

ADDRESS

tSCE

CE

tAW

WE

tSA

tPWE

tHA

CY62147DV30

BHE/BLE

tBW

OE

tSD

DATA I/O

NOTE23

tHZOE

DATAIN

tHD

Write Cycle No. 2 (CE Controlled)[17, 21, 22]

tWC

ADDRESS

tSCE

CE

tSA

tAW

tPWE

tHA

WE

BHE/BLE

tBW

OE

tSD

DATAI/O

NOTE23

tHZOE

Notes:

21.Data I/O is high impedance if OE = VIH.

22.If CE goes HIGH simultaneously with WE = VIH, the output remains in a high-impedance state.23.During this period, the I/Os are in output state and input signals should not be applied.

tHD

DATAIN

Document #: 38-05340 Rev. *FPage 7 of 12

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Switching Waveforms (continued)

Write Cycle No. 3 (WE Controlled, OE LOW)[22]

tWC

ADDRESS

tSCE

CE

tBW

CY62147DV30

BHE/BLE

tAW

tSA

WE

tHA

tPWE

tSD

DATAI/O

NOTE 23

tHZWE

DATAIN

tHD

tLZWE

Write Cycle No. 4 (BHE/BLE Controlled, OE LOW)[22]

tWC

ADDRESS

CE

tSCEtAWBHE/BLEtSAWEtHZWE

tHAtBWtPWEtSDDATAINtLZWE

tHD

DATA I/ONOTE 23

Document #: 38-05340 Rev. *FPage 8 of 12

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CY62147DV30

Truth Table

CEHXLLLLLLLLL

WEXXHHHHHHLLL

OEXXLLLHHHXXX

BHEXHLHLLHLLHL

BLEXHLLHLLHLLH

Inputs/OutputsHigh ZHigh Z

Data Out (I/OO–I/O15)Data Out (I/OO–I/O7);I/O8–I/O15 in High ZData Out (I/O8–I/O15);I/O0–I/O7 in High ZHigh ZHigh ZHigh Z

Data In (I/OO–I/O15)Data In (I/OO–I/O7);I/O8–I/O15 in High ZData In (I/O8–I/O15);I/O0–I/O7 in High Z

Mode

Deselect/Power-DownDeselect/Power-DownReadReadRead

Output DisabledOutput DisabledOutput DisabledWriteWriteWrite

Power

Standby (ISB)Standby (ISB)Active (ICC)Active (ICC)Active (ICC)Active (ICC)Active (ICC)Active (ICC)Active (ICC)Active (ICC)Active (ICC)

Ordering Information

Speed(ns)4555

Ordering CodeCY62147DV30LL-45BVXICY62147DV30LL-45ZSXICY62147DV30LL-55BVICY62147DV30LL-55BVXICY62147DV30LL-55ZSXICY62147DV30L-55BVXECY62147DV30L-55ZSXE70

CY62147DV30LL-70BVICY62147DV30LL-70BVXA

Package Diagram

Package Type

Operating RangeIndustrialIndustrial

51-8515048-ball (6 mm × 8mm × 1 mm) VFBGA (Pb-free)51-8508744-pin TSOP II (Pb-free)

51-8515048-ball (6 mm × 8mm × 1 mm) VFBGA

48-ball (6 mm × 8mm × 1 mm) VFBGA (Pb-free)

51-8508744-pin TSOP II (Pb-free)

51-8515048-ball (6 mm × 8mm × 1 mm) VFBGA (Pb-free)51-8508744-pin TSOP II (Pb-free)

51-8515048-ball (6 mm × 8mm × 1 mm) VFBGA

48-ball (6 mm × 8mm × 1 mm) VFBGA (Pb-free)

Automotive-EIndustrialAutomotive-A

Document #: 38-05340 Rev. *FPage 9 of 12

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CY62147DV30

Package Diagram

48-ball VFBGA (6 x 8 x 1 mm) (51-85150)TOPVIEWA1CORNER123456ABC01.0D±00E.8FGHAB6.00±0.10.XCA5M5250..050C.0±1021..00SEATINGPLANE.XCAXMA6M20.00.1Document #: 38-05340 Rev. *FBOTTOMVIEWA1CORNERØ0.05MCØ0.25MCABØ0.30±0.05(48X)654321ABC507.10D.502±.05E0.852F6.2GHA1.8750.753.75B6.00±0.100.15(4X)51-85150-*DPage 10 of 12

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Package Diagram (continued)

44-Pin TSOP II (51-85087)

CY62147DV30

51-85087-*A

MoBL is a registered trademark, and More Battery Life is a trademark, of Cypress Semiconductor Corporation. All product andcompany names mentioned in this document may be the trademarks of their respective holders.

Document #: 38-05340 Rev. *FPage 11 of 12

© Cypress Semiconductor Corporation, 2006. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the useof any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to beused for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize itsproducts for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypressproducts in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.

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Document History Page

Document Title:CY62147DV30 MoBL® 4-Mbit (256K x 16) Static RAMDocument Number: 38-05340REV.***A*B

ECN NO.Issue Date127481131010213252

06/17/0301/23/04See ECN

Orig. of ChangeHRTCBDAJU

New Data Sheet

Changed from Advance to Preliminary

Description of Change

CY62147DV30

Changed from Preliminary to FinalAdded 70 ns speed bin

Modified footnote 7 to include ramp time and wait timeModified input and output capacitance values to 10 pFModified Thermal Resistance values on page 4

Added “Byte power-down feature” in the features sectionModified Ordering Information for Pb-free partsModified ordering information for 70-ns Speed Bin

Added 45-ns Speed Bin in AC, DC and Ordering Information tablesAdded Footnote #10 on page #4

Added Pb-free package ordering information on page # 9

Changed 44-lead TSOP-II package name on page 11 from Z44 to ZS44Standardized Icc values across ‘L’ and ‘LL’ binsAdded Automotive product informationAdded Automotive-A rangeAdded note# 9 on page# 3

Updated ordering information table

*C*D

257349316039

See ECNSee ECN

PCIPCI

*E*F

330365498575

See ECNSee ECN

AJUNXR

Document #: 38-05340 Rev. *FPage 12 of 12

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